Microscope Spectrophotometers

The MSV-5000 series is a microscopic spectrophotometer system providing transmittance/reflectance measurements of a microscopic sample area with a wide wavelength range from ultraviolet to near infrared.

A broad range of applications including the collection of transmittance/reflectance spectra of a sample, measurement of the band gap and film thickness of semiconductors, evaluation of the optical characteristics of functional crystals and the color analysis of microscopic samples can be easily implemented using the MSV-5000 series

UV-Vis/NIR Microscope Spectrophotometers

• MSV-5100 Spectrophotometer is a dedicated UV-Vis microscope with a wavelength range    of (200-900 nm).
• MSV-5200 Spectrophotometer includes a Peltier-cooled PbS detector and has a wavelength range of (200-2700 nm).
• MSV-5300 Spectrophotometer incorporates an InGaAs detector to obtain optimized NIR measurements and has a wavelength range of (200-1600 nm).

The wide-band cassegrain objectives provide continuous transmittance/reflectance measurements for the entire spectral range required, without the use of expensive, coated refractive objectives. An optional automated XYZ stage also offers mapping/imaging capability for larger samples.

The CMOS camera options include binocular viewing, polarized observation and selected refractive objective lenses.

All models incorporate a user-selectable slitwidth for variable spectral resolution as well as selectable circular apertures and an adjustable rectangular aperture for sample area discrimination.

A unique, single platform software package for any JASCO spectroscopy system

JASCO is the first manufacturer to develop a powerful, cross-platform software package, “Spectra Manager”, for controlling a wide range of spectroscopic instrumentation. The Spectra Manager program is a comprehensive package for capturing and processing data, eliminating the need to learn multiple software packages and offering the user a shallower learning curve.

Several types of measurement data files (UV-Vis/NIR, FT-IR, Fluorescence, etc.) can be viewed in a single window, and processed using a full range of data manipulation functions.